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British nano magnetic ezAFM+ exquisite atomic force microscope appeared at Pittsburgh Scientific Instrument Exhibition
From February 27th to March 1st, 2018, the 69th Pittsburgh Laboratory Analytical Instruments Exhibition and Scientific Instruments Exhibition (PITTCON) was held in Orlando, Florida, USA. NanoMagnetics Instruments, the world's leading brand of cryogenic AFM models, participated in the ball's largest analytical chemistry, scientific analysis and laboratory exhibition, which was the third time NMI exhibited at the Pittsburgh Scientific Instruments Show.
The exhibition attracted exhibitors from around the world as well as from Canada, China, France, Germany, Italy, Japan, the Netherlands and the United Kingdom, as well as over 20,000 people from the same industry, academia or government in more than 90 countries. The audience came to the exhibition.
ezAFM+ is the latest design of atomic force microscope designed by NanoMagnetics. Like ezAFM, this product has the characteristics of compact design, beautiful appearance, high stability and small space. The software is powerful and easy to operate.
The user interface is good, and the price is very good, and the price is very high. It is an ideal laboratory atomic force microscope for a wide range of applications in higher education, nanotechnology education and basic research.
Compared to ezAFM, ezAFM+ is more powerful and the results are even more exciting.
ezAFM+ is a brand new atomic force microscope with excellent performance.
Product advantages:
Easy to use: no need to be an expert. Watch our instructional videos and use them right away.
Easy to use: Take it with you and start working in 5 minutes.
After sales support: Any questions? Please let us know. The software has built-in help modules, and as long as it can connect to the Internet, our team of experts can help with remote assistance.
More powerful specifications and even more impressive results.
See: http://www.ezafm.com/results.html
Please contact: NMI China Representative Office, Nano Magnetic Technology (Beijing) Co., Ltd.
Technical specifications:
Arbitrarily aligned design pattern
Scanning range: 120 × 120 × 40 μm or 40 × 40 × 4 μm (XYZ)
Z-axis resolution: Z resolution <0.2nm, in the 120μmx120μm scanning range
Z-axis resolution: Z resolution < 0.02nm, in the 40nm x 40μm scan range
Inherent noise: <75fm√Hz
Lateral resolution: <16nm for large-scale scans and <5nm for small scans
Sample size: no limit
Features: portable, user friendly, affordable, large scanning area (x, y, z), low pressure operation
mode:
Intermittent contact
Phase imaging / phase contrast
Contact mode / static
Lateral force microscope (LFM)
Magnetic force microscope (MFM)
Electrostatic force microscope (EFM)
Piezoelectric Response Microscope (PRFM)
Kelvin Probe Force Microscope (KPFM)
Force modulation
Conductive AFM (c-AFM)
Scanning Diffusion Resistance Microscopy (SSRM)
Multispectral mode
Lithography and mode of operation
Liquid mode
(Excerpt from China Education Equipment Purchasing Network)