EN
HALL EFFECT MEASUREMENT SYSTEM
HALL EFFECT MEASUREMENT SYSTEM is used to measure the important parameters of Semiconductor Materials such as Carrier Concentration, Mobility, Resistivity, and Hall Coefficient, and so on. These parameters must be grasped and controlled in advance in order to understand the electrical characteristics of semiconductor materials. Therefore, the Hall Effect Measurement System is an indispensable tool for understanding and studying the electrical characteristics of Semiconductor Devices and Semiconductor Materials. The experimental results are automatically calculated by the software, and the Bulk Carrier Concentration, Sheet Carrier Concentration, Mobility, Resistivity, Hall Coefficient, Magneto-Resistance, and other parameters can be obtained at the same time.
Product Features
Stable Performance
Powerful Function
High Cost-effectiveness
Lightweight and Convenient,Easy to Portable
Names of Accessories For Each Part
Application
● Semiconductor Materials：SiGe, SiC, InAs, InGaAs, InP, AlGaAs, HgCdTe, Ferrite Material, and etc.
● Low-Impedance Materials：Graphene, Metals, Transparent Oxides,Weak Magnetic Semiconductor Materials,TMR Materials, and etc.
● High-Impedance Materials：Semi-Insulating GaAs, GaN, CdTe, and etc.
●Conductive Material Particles：P-Type and N-Type Tests of Materials
●Widely used： Universities, Research Institutes, Semiconductor, Metal, High Thermal Conductivity Organic New Materials and other Industries
Inquiry
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